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Optical Metrology 2010

is an international conference for integration of optical measuring techniques in industry and research.

The Optical Metrology Conference is a unique event in bringing industry leaders together. Our goal is to offer a platform for managers, metrologists, technology and research experts to exchange application experiences.

Optical Metrology 2010 is split into two conferences

Deformation Measurement
in Material, Component Testing and 3D Motion Analysis
20.09 until 21.09.2010

Preliminary Program >

Digitizing
in Quality Control, Inspection and Reverse Engineering
22.09 until 23.09.2010

Preliminary Program >

The conference is free to attend and held in Braunschweig, Germany.

GOM has been hosting regular international conferences for over 10 years. The event is attended by participants from the automotive, aviation and power generation industries, their suppliers, various manufactures of consumer goods, research centers and universities. The conferences offer attendees the opportunity to exchange ideas, learn new techniques and enhance processes, learning from colleagues both from similar and different industries.

Registration >

Optical Metrology 2010
  • Discuss common issues
  • Exchange ideas
  • Enhance processes
  • Learn new technologies
  • Share know-how with colleagues